Optimum Source Resolvability Rate with Respect to f-Divergences Using the Smooth Rényi Entropy

Ryo Nomura, Hideki Yagi. Optimum Source Resolvability Rate with Respect to f-Divergences Using the Smooth Rényi Entropy. In IEEE International Symposium on Information Theory, ISIT 2020, Los Angeles, CA, USA, June 21-26, 2020. pages 2286-2291, IEEE, 2020. [doi]

Abstract

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