Takayasu Norimatsu, Takashi Kawamoto, Kenji Kogo, Naohiro Kohmu, Fumio Yuki, Norio Nakajima, Takashi Muto, Junya Nasu, Takemasa Komori, Hideki Koba, Tatsunori Usugi, Tomofumi Hokari, Tsuneo Kawamata, Yuichi Ito, Seiichi Umai, Masatoshi Tsuge, Takeo Yamashita, Masatoshi Hasegawa, Keiichi Higeta. 3.3 A 25Gb/s multistandard serial link transceiver for 50dB-loss copper cable in 28nm CMOS. In 2016 IEEE International Solid-State Circuits Conference, ISSCC 2016, San Francisco, CA, USA, January 31 - February 4, 2016. pages 60-61, IEEE, 2016. [doi]
@inproceedings{NorimatsuKKKYNM16,
title = {3.3 A 25Gb/s multistandard serial link transceiver for 50dB-loss copper cable in 28nm CMOS},
author = {Takayasu Norimatsu and Takashi Kawamoto and Kenji Kogo and Naohiro Kohmu and Fumio Yuki and Norio Nakajima and Takashi Muto and Junya Nasu and Takemasa Komori and Hideki Koba and Tatsunori Usugi and Tomofumi Hokari and Tsuneo Kawamata and Yuichi Ito and Seiichi Umai and Masatoshi Tsuge and Takeo Yamashita and Masatoshi Hasegawa and Keiichi Higeta},
year = {2016},
doi = {10.1109/ISSCC.2016.7417906},
url = {http://dx.doi.org/10.1109/ISSCC.2016.7417906},
researchr = {https://researchr.org/publication/NorimatsuKKKYNM16},
cites = {0},
citedby = {0},
pages = {60-61},
booktitle = {2016 IEEE International Solid-State Circuits Conference, ISSCC 2016, San Francisco, CA, USA, January 31 - February 4, 2016},
publisher = {IEEE},
isbn = {978-1-4673-9467-3},
}