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New NBTI models for degradation and relaxation kinetics valid over extended temperature and stress/recovery ranges

D. Nouguier, X. Federspiel, G. Ghibaudo, M. Rafik, David Roy 0001. New NBTI models for degradation and relaxation kinetics valid over extended temperature and stress/recovery ranges. Microelectronics Reliability, 87:106-112, 2018. [doi]

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