Comparison between BSIM4.X and HSPICE flicker noise models in NMOS and PMOS transistors in all operating regions

T. Noulis, S. Siskos, G. Sarrabayrouse. Comparison between BSIM4.X and HSPICE flicker noise models in NMOS and PMOS transistors in all operating regions. Microelectronics Reliability, 47(8):1222-1227, 2007. [doi]

Abstract

Abstract is missing.