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Ondrej Novák, Jiri Jenícek, Martin Rozkovec. Sequential test decompressors with fast variable wide spreading. In 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Kosice, Slovakia, April 20-22, 2016. pages 132-137, IEEE, 2016. [doi]

The following publications are possibly variants of this publication:

Sequential Test Decompressors with Fast Tester Bits Wide-SpreadingOndrej Novák, Jiri Jenícek, Martin Rozkovec. jcsc, 26(8):1-16, 2017. [doi]

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