Sequential Test Decompressors with Fast Tester Bits Wide-Spreading

Ondrej Novák, Jiri Jenícek, Martin Rozkovec. Sequential Test Decompressors with Fast Tester Bits Wide-Spreading. Journal of Circuits, Systems, and Computers, 26(8):1-16, 2017. [doi]

Authors

Ondrej Novák

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Jiri Jenícek

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Martin Rozkovec

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