Ondrej Novák, Jiri Jenícek, Martin Rozkovec. Sequential Test Decompressors with Fast Tester Bits Wide-Spreading. Journal of Circuits, Systems, and Computers, 26(8):1-16, 2017. [doi]
@article{NovakJR17,
title = {Sequential Test Decompressors with Fast Tester Bits Wide-Spreading},
author = {Ondrej Novák and Jiri Jenícek and Martin Rozkovec},
year = {2017},
doi = {10.1142/S0218126617400011},
url = {https://doi.org/10.1142/S0218126617400011},
researchr = {https://researchr.org/publication/NovakJR17},
cites = {0},
citedby = {0},
journal = {Journal of Circuits, Systems, and Computers},
volume = {26},
number = {8},
pages = {1-16},
}