Ondrej Novák, Jiri Nosek. Test-per-Clock Testing of the Circuits with Scan. In 7th IEEE International On-Line Testing Workshop (IOLTW 2001), 9-11 July 2001, Taormina, Italy. pages 90, IEEE Computer Society, 2001. [doi]
@inproceedings{NovakN01:0,
title = {Test-per-Clock Testing of the Circuits with Scan},
author = {Ondrej Novák and Jiri Nosek},
year = {2001},
url = {http://csdl.computer.org/comp/proceedings/ioltw/2001/1290/00/12900090abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/NovakN01%3A0},
cites = {0},
citedby = {0},
pages = {90},
booktitle = {7th IEEE International On-Line Testing Workshop (IOLTW 2001), 9-11 July 2001, Taormina, Italy},
publisher = {IEEE Computer Society},
isbn = {0-7695-1290-9},
}