Md A. Obaida, Eric Nelson, Rene V. Ee, Israt Jahan, Sayeed Z. Sajal. Interactive sensitive data exposure detection through static analysis. In IEEE International Conference on Electro Information Technology, EIT 2017, Lincoln, NE, USA, May 14-17, 2017. pages 270-275, IEEE, 2017. [doi]
Abstract is missing.