Marie Engelene J. Obien, Satoshi Ohtake, Hideo Fujiwara. F-Scan Test Generation Model for Delay Fault Testing at RTL Using Standard Full Scan ATPG. In 16th European Test Symposium (ETS 2011), May 23-27, 2011, Trondheim, Norway. pages 203, IEEE Computer Society, 2011. [doi]
@inproceedings{ObienOF11-0,
title = {F-Scan Test Generation Model for Delay Fault Testing at RTL Using Standard Full Scan ATPG},
author = {Marie Engelene J. Obien and Satoshi Ohtake and Hideo Fujiwara},
year = {2011},
doi = {10.1109/ETS.2011.61},
url = {http://doi.ieeecomputersociety.org/10.1109/ETS.2011.61},
tags = {testing},
researchr = {https://researchr.org/publication/ObienOF11-0},
cites = {0},
citedby = {0},
pages = {203},
booktitle = {16th European Test Symposium (ETS 2011), May 23-27, 2011, Trondheim, Norway},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-4433-5},
}