Marie Engelene J. Obien, Satoshi Ohtake, Hideo Fujiwara. F-Scan Test Generation Model for Delay Fault Testing at RTL Using Standard Full Scan ATPG. In 16th European Test Symposium (ETS 2011), May 23-27, 2011, Trondheim, Norway. pages 203, IEEE Computer Society, 2011. [doi]
Abstract is missing.