Gaines Odom, Zakia Tamanna Tisha, Ujjwal Guin. A Novel Self-referencing Approach Using Memory Power-up States for Detecting COTS SRAMs. In 42nd IEEE VLSI Test Symposium, VTS 2024, Tempe, AZ, USA, April 22-24, 2024. pages 1-7, IEEE, 2024. [doi]
Abstract is missing.