Jürgen Oehm, Ulrich Grünebaum, Klaus Schumacher. Mismatch effects explained by the spectral model [MOS devices]. In 6th IEEE International Conference on Electronics, Circuits and Systems, ICECS 1999, Pafos, Cyprus, September 5-8, 1999. pages 1055-1058, IEEE, 1999. [doi]
Abstract is missing.