Nati Ofir, Ran Yacobi, Omer Granoviter, Boris Levant, Ore Shtalrid. Automatic Defect Segmentation by Unsupervised Anomaly Learning. In 2022 IEEE International Conference on Image Processing, ICIP 2022, Bordeaux, France, 16-19 October 2022. pages 306-310, IEEE, 2022. [doi]
Abstract is missing.