Validation of a Full-Chip Simulation Model for Supply Noise and Delay Dependence on Average Voltage Drop With On-Chip Delay Measurement - researchr publication

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Yasuhiro Ogasahara, Takashi Enami, Masanori Hashimoto, Takashi Sato, Takao Onoye. Validation of a Full-Chip Simulation Model for Supply Noise and Delay Dependence on Average Voltage Drop With On-Chip Delay Measurement. IEEE Trans. on Circuits and Systems, 54-II(10):868-872, 2007. [doi]

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