Tomohiko Ogawa, Haruo Kobayashi, Satoshi Uemori, Yohei Tan, Satoshi Ito, Nobukazu Takai, Takahiro J. Yamaguchi, Kiichi Niitsu. Design for Testability That Reduces Linearity Testing Time of SAR ADCs. IEICE Transactions, 94-C(6):1061-1064, 2011. [doi]
Abstract is missing.