Summing Node Test Method: Simultaneous Multiple AC Characteristics Testing of Multiple Operational Amplifiers - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Gaku Ogihara, Takayuki Nakatani, Akemi Hatta, Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Anna Kuwana, Riho Aoki, Shogo Katayama, Jianglin Wei, Yujie Zhao, Jianlong Wang, Kazumi Hatayama, Haruo Kobayashi 0001. Summing Node Test Method: Simultaneous Multiple AC Characteristics Testing of Multiple Operational Amplifiers. In 29th IEEE Asian Test Symposium, ATS 2020, Penang, Malaysia, November 23-26, 2020. pages 1-6, IEEE, 2020. [doi]

This author has not been identified. Look up 'Gaku Ogihara' in GoogleThis author has not been identified. Look up 'Takayuki Nakatani' in GoogleThis author has not been identified. Look up 'Akemi Hatta' in GoogleThis author has not been identified. Look up 'Keno Sato' in GoogleThis author has not been identified. Look up 'Takashi Ishida' in GoogleThis author has not been identified. Look up 'Toshiyuki Okamoto' in GoogleThis author has not been identified. Look up 'Tamotsu Ichikawa' in GoogleThis author has not been identified. Look up 'Anna Kuwana' in GoogleThis author has not been identified. Look up 'Riho Aoki' in GoogleThis author has not been identified. Look up 'Shogo Katayama' in GoogleThis author has not been identified. Look up 'Jianglin Wei' in GoogleThis author has not been identified. Look up 'Yujie Zhao' in GoogleThis author has not been identified. Look up 'Jianlong Wang' in GoogleThis author has not been identified. Look up 'Kazumi Hatayama' in GoogleThis author has not been identified. Look up 'Haruo Kobayashi 0001' in Google

runs on WebDSL