Saeyoon Oh, Seongmin Lee 0001, Shin Yoo. Effectively Sampling Higher Order Mutants Using Causal Effect. In 14th IEEE International Conference on Software Testing, Verification and Validation Workshops, ICST Workshops 2021, Porto de Galinhas, Brazil, April 12-16, 2021. pages 19-24, IEEE, 2021. [doi]
Abstract is missing.