Sang-Chul Oh, Jae-Ho Kim, Ho-Jeong Choi, Si-Don Choi, Ki Tae Park, Jong-Woo Park, Wha-Joon Lee. Automatic Failure-Analysis System for High-Density DRAM. In Proceedings IEEE International Test Conference 1994, TEST: The Next 25 Years, Washington, DC, USA, October 2-6, 1994. pages 526-530, IEEE Computer Society, 1994.
@inproceedings{OhKCCPPL94,
title = {Automatic Failure-Analysis System for High-Density DRAM},
author = {Sang-Chul Oh and Jae-Ho Kim and Ho-Jeong Choi and Si-Don Choi and Ki Tae Park and Jong-Woo Park and Wha-Joon Lee},
year = {1994},
tags = {analysis},
researchr = {https://researchr.org/publication/OhKCCPPL94},
cites = {0},
citedby = {0},
pages = {526-530},
booktitle = {Proceedings IEEE International Test Conference 1994, TEST: The Next 25 Years, Washington, DC, USA, October 2-6, 1994},
publisher = {IEEE Computer Society},
isbn = {0-7803-2103-0},
}