Sang-Chul Oh, Jae-Ho Kim, Ho-Jeong Choi, Si-Don Choi, Ki Tae Park, Jong-Woo Park, Wha-Joon Lee. Automatic Failure-Analysis System for High-Density DRAM. In Proceedings IEEE International Test Conference 1994, TEST: The Next 25 Years, Washington, DC, USA, October 2-6, 1994. pages 526-530, IEEE Computer Society, 1994.
Abstract is missing.