Comparison of Electrical Characteristics Between SiC and Si Substrate

Si Eun Oh, Seo Yoon Kim, Se Yong Choi, Seung Jae Moon, Jong Mo Lee, Byung Seong Bae. Comparison of Electrical Characteristics Between SiC and Si Substrate. In International Conference on Electronics, Information, and Communication, ICEIC 2024, Taipei, Taiwan, January 28-31, 2024. pages 1-4, IEEE, 2024. [doi]

Abstract

Abstract is missing.