Eunjung Oh, Soo-Hyun Kim, Dong-Ik Lee, Ho-Yong Choi. High-Level Test Generation for Asynchronous Circuits from Signal Transition Graph. IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 85-A(12):2674-2683, 2002. [doi]
@article{OhKLC02,
title = {High-Level Test Generation for Asynchronous Circuits from Signal Transition Graph},
author = {Eunjung Oh and Soo-Hyun Kim and Dong-Ik Lee and Ho-Yong Choi},
year = {2002},
url = {http://search.ieice.org/bin/summary.php?id=e85-a_12_2674},
researchr = {https://researchr.org/publication/OhKLC02},
cites = {0},
citedby = {0},
journal = {IEICE Trans. Fundam. Electron. Commun. Comput. Sci.},
volume = {85-A},
number = {12},
pages = {2674-2683},
}