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Eunjung Oh, Soo-Hyun Kim, Dong-Ik Lee, Ho-Yong Choi. High-Level Test Generation for Asynchronous Circuits from Signal Transition Graph. IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 85-A(12):2674-2683, 2002. [doi]
Abstract is missing.