Jong-Hwan Oh, Byoung-Ju Yun, Se-Yun Kim, Kil-Houm Park. A Development of the TFT-LCD Image Defect Inspection Method Based on Human Visual System. IEICE Transactions, 91-A(6):1400-1407, 2008. [doi]
@article{OhYKP08,
title = {A Development of the TFT-LCD Image Defect Inspection Method Based on Human Visual System},
author = {Jong-Hwan Oh and Byoung-Ju Yun and Se-Yun Kim and Kil-Houm Park},
year = {2008},
doi = {10.1093/ietfec/e91-a.6.1400},
url = {http://dx.doi.org/10.1093/ietfec/e91-a.6.1400},
tags = {rule-based},
researchr = {https://researchr.org/publication/OhYKP08},
cites = {0},
citedby = {0},
journal = {IEICE Transactions},
volume = {91-A},
number = {6},
pages = {1400-1407},
}