A Development of the TFT-LCD Image Defect Inspection Method Based on Human Visual System

Jong-Hwan Oh, Byoung-Ju Yun, Se-Yun Kim, Kil-Houm Park. A Development of the TFT-LCD Image Defect Inspection Method Based on Human Visual System. IEICE Transactions, 91-A(6):1400-1407, 2008. [doi]

Abstract

Abstract is missing.