Y. Ohkura, Toru Toyabe, H. Masuda. Analysis of MOSFET Capacitances and Their Behavior at Short-Channel Lengths Using an AC Device Simulator. IEEE Trans. on CAD of Integrated Circuits and Systems, 6(3):423-430, 1987. [doi]
@article{OhkuraTM87,
title = {Analysis of MOSFET Capacitances and Their Behavior at Short-Channel Lengths Using an AC Device Simulator},
author = {Y. Ohkura and Toru Toyabe and H. Masuda},
year = {1987},
url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=28441&arnumber=1270288&count=21&index=13},
tags = {analysis},
researchr = {https://researchr.org/publication/OhkuraTM87},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {6},
number = {3},
pages = {423-430},
}