Philipp Öhler, Sybille Hellebrand, Hans-Joachim Wunderlich. An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy. In 12th European Test Symposium (ETS 2007), 20 May 2007, Freiburg, Germany. pages 91-96, IEEE Computer Society, 2007. [doi]
Abstract is missing.