Scanpath Prediction Based on Areas of Interest

Towa Ohno, Junya Hara, Yuichi Tanaka 0001, Hiroshi Higashi. Scanpath Prediction Based on Areas of Interest. In IEEE International Conference on Consumer Electronics, ICCE 2026, Dubai, United Arab Emirates, February 3-5, 2026. pages 1-6, IEEE, 2026. [doi]

Abstract

Abstract is missing.