Detection of Random Correction from Source Code Snapshots

Yu Ohno, Hidetake Uwano, Shinji Uchida. Detection of Random Correction from Source Code Snapshots. In Proceedings of the 8th International Conference on Software and Computer Applications, ICSCA '19, Penang, Malaysia, February 19-21, 2019. pages 491-495, ACM, 2019. [doi]

Authors

Yu Ohno

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Hidetake Uwano

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Shinji Uchida

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