Yu Ohno, Hidetake Uwano, Shinji Uchida. Detection of Random Correction from Source Code Snapshots. In Proceedings of the 8th International Conference on Software and Computer Applications, ICSCA '19, Penang, Malaysia, February 19-21, 2019. pages 491-495, ACM, 2019. [doi]
@inproceedings{OhnoUU19,
title = {Detection of Random Correction from Source Code Snapshots},
author = {Yu Ohno and Hidetake Uwano and Shinji Uchida},
year = {2019},
doi = {10.1145/3316615.3316621},
url = {https://doi.org/10.1145/3316615.3316621},
researchr = {https://researchr.org/publication/OhnoUU19},
cites = {0},
citedby = {0},
pages = {491-495},
booktitle = {Proceedings of the 8th International Conference on Software and Computer Applications, ICSCA '19, Penang, Malaysia, February 19-21, 2019},
publisher = {ACM},
isbn = {978-1-4503-6573-4},
}