H. Ohyama, M. Nakabayashi, E. Simoen, C. Claeys, T. Tanaka, T. Hirao, S. Onada, K. Kobayashi. Radiation damages of polycrystalline silicon films and npn Si transistors by high-energy particle irradiation. Microelectronics Reliability, 41(9-10):1443-1448, 2001.
@article{OhyamaNSCTHOK01,
title = {Radiation damages of polycrystalline silicon films and npn Si transistors by high-energy particle irradiation},
author = {H. Ohyama and M. Nakabayashi and E. Simoen and C. Claeys and T. Tanaka and T. Hirao and S. Onada and K. Kobayashi},
year = {2001},
tags = {C++, e-science},
researchr = {https://researchr.org/publication/OhyamaNSCTHOK01},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {41},
number = {9-10},
pages = {1443-1448},
}