H. Ohyama, E. Simoen, S. Kuroda, C. Claeys, Y. Takami, T. Hakata, K. Kobayashi, M. Nakabayashi, H. Sunaga. Degradation and recovery of AlGaAs/GaAs p-HEMT irradiated by high-energy particle. Microelectronics Reliability, 41(1):79-85, 2001. [doi]
@article{OhyamaSKCTHKNS01,
title = {Degradation and recovery of AlGaAs/GaAs p-HEMT irradiated by high-energy particle},
author = {H. Ohyama and E. Simoen and S. Kuroda and C. Claeys and Y. Takami and T. Hakata and K. Kobayashi and M. Nakabayashi and H. Sunaga},
year = {2001},
doi = {10.1016/S0026-2714(00)00073-1},
url = {http://dx.doi.org/10.1016/S0026-2714(00)00073-1},
tags = {C++},
researchr = {https://researchr.org/publication/OhyamaSKCTHKNS01},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {41},
number = {1},
pages = {79-85},
}