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Edge-based texture measures for surface inspection

Timo Ojala, Matti Pietikäinen, Olli Silvén. Edge-based texture measures for surface inspection. In 11th IAPR International Conference on Pattern Recognition, ICPR 1992. Conference B: Pattern Recognition Methodology and Systems, The Hague, Netherlands, August 30-September 3, 1992. pages 594-598, IEEE, 1992. [doi]

Authors

Timo Ojala

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Matti Pietikäinen

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Olli Silvén

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