Timo Ojala, Matti Pietikäinen, Olli Silvén. Edge-based texture measures for surface inspection. In 11th IAPR International Conference on Pattern Recognition, ICPR 1992. Conference B: Pattern Recognition Methodology and Systems, The Hague, Netherlands, August 30-September 3, 1992. pages 594-598, IEEE, 1992. [doi]
@inproceedings{OjalaPS92,
title = {Edge-based texture measures for surface inspection},
author = {Timo Ojala and Matti Pietikäinen and Olli Silvén},
year = {1992},
doi = {10.1109/ICPR.1992.201848},
url = {https://doi.org/10.1109/ICPR.1992.201848},
researchr = {https://researchr.org/publication/OjalaPS92},
cites = {0},
citedby = {0},
pages = {594-598},
booktitle = {11th IAPR International Conference on Pattern Recognition, ICPR 1992. Conference B: Pattern Recognition Methodology and Systems, The Hague, Netherlands, August 30-September 3, 1992},
publisher = {IEEE},
}