Ojaswee, Akshay Agarwal 0001, Nalini K. Ratha. Benchmarking Image Classifiers for Physical Out-of-Distribution Examples Detection. In IEEE/CVF International Conference on Computer Vision, ICCV 2023 - Workshops, Paris, France, October 2-6, 2023. pages 4429-4437, IEEE, 2023. [doi]
Abstract is missing.