Saburo Okada, Masaaki Imade, Hidekazu Miyauchi, Tetsuhiro Sumimoto, Hideki Yamamoto. Detection and Discrimination of Surface Defects by Analyzing Diffraction Pattern of Laser Beam. In Proceedings of IAPR Workshop on Machine Vision Applications, MVA 1992, December December 7-9, 1992, Tokyo, Japan. pages 425-428, 1992. [doi]
Abstract is missing.