Satoshi Okada, Takuho Mitsunaga. Practical Adversarial Attacks on Industrial AI: Evaluating Camera Sticker Techniques with MVTec AD. In IEEE International Conference on Omni-layer Intelligent Systems, COINS 2025, Madison, WI, USA, August 4-6, 2025. pages 1-7, IEEE, 2025. [doi]
Abstract is missing.