Hiroyuki Okamura, Yusuke Etani, Tadashi Dohi. A Multi-factor Software Reliability Model Based on Logistic Regression. In IEEE 21st International Symposium on Software Reliability Engineering, ISSRE 2010, San Jose, CA, USA, 1-4 November 2010. pages 31-40, IEEE Computer Society, 2010. [doi]
@inproceedings{OkamuraED10,
title = {A Multi-factor Software Reliability Model Based on Logistic Regression},
author = {Hiroyuki Okamura and Yusuke Etani and Tadashi Dohi},
year = {2010},
doi = {10.1109/ISSRE.2010.14},
url = {http://dx.doi.org/10.1109/ISSRE.2010.14},
tags = {rule-based, reliability},
researchr = {https://researchr.org/publication/OkamuraED10},
cites = {0},
citedby = {0},
pages = {31-40},
booktitle = {IEEE 21st International Symposium on Software Reliability Engineering, ISSRE 2010, San Jose, CA, USA, 1-4 November 2010},
publisher = {IEEE Computer Society},
}