Hiroyuki Okamura, Yusuke Etani, Tadashi Dohi. A Multi-factor Software Reliability Model Based on Logistic Regression. In IEEE 21st International Symposium on Software Reliability Engineering, ISSRE 2010, San Jose, CA, USA, 1-4 November 2010. pages 31-40, IEEE Computer Society, 2010. [doi]
Abstract is missing.