Hiroyuki Okamura, Hitoshi Furumura, Tadashi Dohi. On the Effect of Fault Removal in Software Testing - Bayesian Reliability Estimation Approach. In 17th International Symposium on Software Reliability Engineering (ISSRE 2006), 7-10 November 2006, Raleigh, North Carolina, USA. pages 247-255, IEEE Computer Society, 2006. [doi]
@inproceedings{OkamuraFD06,
title = {On the Effect of Fault Removal in Software Testing - Bayesian Reliability Estimation Approach},
author = {Hiroyuki Okamura and Hitoshi Furumura and Tadashi Dohi},
year = {2006},
doi = {10.1109/ISSRE.2006.33},
url = {http://doi.ieeecomputersociety.org/10.1109/ISSRE.2006.33},
tags = {testing, reliability, systematic-approach},
researchr = {https://researchr.org/publication/OkamuraFD06},
cites = {0},
citedby = {0},
pages = {247-255},
booktitle = {17th International Symposium on Software Reliability Engineering (ISSRE 2006), 7-10 November 2006, Raleigh, North Carolina, USA},
publisher = {IEEE Computer Society},
}