Hiroyuki Okamura, Hitoshi Furumura, Tadashi Dohi. On the Effect of Fault Removal in Software Testing - Bayesian Reliability Estimation Approach. In 17th International Symposium on Software Reliability Engineering (ISSRE 2006), 7-10 November 2006, Raleigh, North Carolina, USA. pages 247-255, IEEE Computer Society, 2006. [doi]
Abstract is missing.