Hideo Okawara. Practical signal processing at mixed signal test venues - Trend removal, noise reduction, wideband signal capturing -. In 29th IEEE VLSI Test Symposium, VTS 2011, May 1-5, 2011, Dana Point, California, USA. pages 322, IEEE Computer Society, 2011. [doi]
@inproceedings{Okawara11,
title = {Practical signal processing at mixed signal test venues - Trend removal, noise reduction, wideband signal capturing -},
author = {Hideo Okawara},
year = {2011},
doi = {10.1109/VTS.2011.5783741},
url = {http://dx.doi.org/10.1109/VTS.2011.5783741},
tags = {testing},
researchr = {https://researchr.org/publication/Okawara11},
cites = {0},
citedby = {0},
pages = {322},
booktitle = {29th IEEE VLSI Test Symposium, VTS 2011, May 1-5, 2011, Dana Point, California, USA},
publisher = {IEEE Computer Society},
}