Pairwise Error Probability Analysis for Power Delay Profile Fingerprinting Based Localization - researchr publication authors

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Turgut Oktem, Dirk T. M. Slock. Pairwise Error Probability Analysis for Power Delay Profile Fingerprinting Based Localization. In Proceedings of the 73rd IEEE Vehicular Technology Conference, VTC Spring 2011, 15-18 May 2011, Budapest, Hungary. pages 1-5, IEEE, 2011. [doi]

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