Pairwise Error Probability Analysis for Power Delay Profile Fingerprinting Based Localization - researchr publication related

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Turgut Oktem, Dirk T. M. Slock. Pairwise Error Probability Analysis for Power Delay Profile Fingerprinting Based Localization. In Proceedings of the 73rd IEEE Vehicular Technology Conference, VTC Spring 2011, 15-18 May 2011, Budapest, Hungary. pages 1-5, IEEE, 2011. [doi]

The following publications are possibly variants of this publication:

Cramer-rao bounds for power delay profile fingerprinting based positioningTurgut Oktem, Dirk T. M. Slock. icassp 2011: 2484-2487 [doi]

Power Delay Doppler Profile Fingerprinting for mobile localization in NLOSTurgut Oktem, Dirk T. M. Slock. pimrc 2010: 876-881 [doi]

Diversity aspects of power delay profile based location fingerprintingDirk T. M. Slock. icassp 2012: 2861-2864 [doi]

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