Hayate Okuhara, Kimiyoshi Usami, Hideharu Amano. A leakage current monitor circuit using silicon on thin BOX MOSFET for dynamic back gate bias control. In 2015 IEEE Symposium in Low-Power and High-Speed Chips, COOL CHIPS XVIII, Yokohama, Japan, April 13-15, 2015. pages 1-3, IEEE, 2015. [doi]
@inproceedings{OkuharaUA15,
title = {A leakage current monitor circuit using silicon on thin BOX MOSFET for dynamic back gate bias control},
author = {Hayate Okuhara and Kimiyoshi Usami and Hideharu Amano},
year = {2015},
doi = {10.1109/CoolChips.2015.7158656},
url = {http://dx.doi.org/10.1109/CoolChips.2015.7158656},
researchr = {https://researchr.org/publication/OkuharaUA15},
cites = {0},
citedby = {0},
pages = {1-3},
booktitle = {2015 IEEE Symposium in Low-Power and High-Speed Chips, COOL CHIPS XVIII, Yokohama, Japan, April 13-15, 2015},
publisher = {IEEE},
isbn = {978-1-4673-7325-8},
}