A 0.15-µm FD-SOI Substrate Bias Control SRAM with Inter-Die Variability Compensation Scheme - researchr publication

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Shunsuke Okumura, Hidehiro Fujiwara, Kosuke Yamaguchi, Shusuke Yoshimoto, Masahiko Yoshimoto, Hiroshi Kawaguchi. A 0.15-µm FD-SOI Substrate Bias Control SRAM with Inter-Die Variability Compensation Scheme. IEICE Transactions, 95-C(4):579-585, 2012. [doi]

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