Daniel A. G. de Oliveira, Sean Blanchard, Nathan DeBardeleben, Fermando Santos, Gabriel Piscoya Dávila, Philippe Olivier Alexandre Navaux, Stephen Wender, Carlo Cazzaniga, Christopher Frost 0002, Robert C. Baumann, Paolo Rech. An Overview of the Risk Posed by Thermal Neutrons to the Reliability of Computing Devices. In 50th Annual IEEE-IFIP International Conference on Dependable Systems and Networks, DSN 2020, Valencia, Spain, June 29 - July 2, 2020 - Supplemental Volume. pages 92-97, IEEE, 2020. [doi]
Abstract is missing.