Rafael N. M. Oliveira, Alan D. Lüdke, Cristina Meinhardt. Radiation Effects in XOR Logic Gates at 16nm CMOS and FinFET Technology. In 26th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2019, Genoa, Italy, November 27-29, 2019. pages 590-593, IEEE, 2019. [doi]
No references recorded for this publication.
No citations of this publication recorded.