On-Line BIST for Performance Failure Prediction Under NBTI-Induced Aging in Safety-Critical Applications - researchr publication

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R. S. Oliveira, Jorge Semião, Isabel C. Teixeira, Marcelino B. Santos, João Paulo Teixeira. On-Line BIST for Performance Failure Prediction Under NBTI-Induced Aging in Safety-Critical Applications. J. Low Power Electronics, 7(4):562-572, 2011. [doi]

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