Test Structures on MCM Active Substrate: Is it worthwhile?

Joan Oliver, Hans G. Kerkhoff. Test Structures on MCM Active Substrate: Is it worthwhile?. In 1996 European Design and Test Conference, ED&TC 1996, Paris, France, March 11-14, 1996. pages 126-130, IEEE Computer Society, 1996. [doi]

Authors

Joan Oliver

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Hans G. Kerkhoff

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